Scanning tunneling microscopy /
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| Formato: | Sin ejemplares |
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Tokyo, Japan :
Japanese Journal of Applied Physics,
1997.
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| Colección: | Japanese journal of applied physics. ;
v. 36, no. 6B |
| Notas: | Cabecera de portada: Special issue. The Fourth Symposium on Scanning Tunneling Microscopy was held at Kanazawa, Japan from December 12 through 14, 1996. |
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| Descripción Física: | p. 2911-3130. |
