Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis : October 31, 1986, Paris, France /

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Detalles Bibliográficos
Autor principal: IEEE Workshop on Expert Systems and Pattern Analysis (1986 : Paris, France)
Autor Corporativo: IEEE Workshop on Expert Systems and Pattern Analysis
Otros Autores: Chen, C. H. 1937-, ed.
Formato: Sin ejemplares
Lenguaje:
Publicado: Singapore ; New Jersey : World Scientific, c1987.
Colección:International Journal of Pattern Recognition and Artificial Intelligence1987 ; 1
Materias:
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245 1 0 |a Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis :  |b October 31, 1986, Paris, France /  |c edited by C.H. Chen. 
260 # # |a Singapore ;  |a New Jersey :  |b World Scientific,  |c c1987. 
300 # # |a v, 126 p. :  |b il., ports. ;  |c 26 cm. 
504 # # |a Incluye referencias bibliográficas. 
111 2 # |a IEEE Workshop on Expert Systems and Pattern Analysis  |d (1986 :  |c Paris, France) 
080 # # |a 681.3:519.713:061.3 
650 # 0 |a Expert systems (Computer science)  |v Congresses. 
650 # 0 |a Pattern recognition systems  |v Congresses. 
700 1 # |a Chen, C. H.  |q (Chi-hau),  |d 1937-,  |e ed.  |4 edt 
490 1 # |a International Journal of Pattern Recognition and Artificial Intelligence1987 ;  |v 1 
040 # # |a WAU  |c WAU  |d NRC  |d OCL  |d BAKER  |b spa  |d arbccab 
500 # # |a Pages also numbered 178-302. 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008727_nuevo-0  |o INT. J. PATTERN RECOGNITION 1987  |p 008727_nuevo-0  |t 1  |y BK