Particle induced x-ray emission and its analytical applications : proceedings of the Fourth International Conference on Particle Induced X-ray Emission and its Analytical Applications, Tallahassee, FL, USA, June 9-13, 1986 /

Particle induced x-ray emission and its analytical applications : proceedings of the Fourth International Conference on Particle Induced X-ray Emission and its Analytical Applications, Tallahassee, FL, USA, June 9-13, 1986 /

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Detalles Bibliográficos
Autor principal: International Conference on Particle Induced X-ray Emission and its Analytical Applications (4th : 1986 : Tallahassee, Fla.)
Autor Corporativo: International Conference on Particle Induced X-ray Emission and its Analytical Applications
Otros Autores: Van Rinsvelt, Henri.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1987.
Colección:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, v. B22, nos. 1-3 (Mar. 1987)
Materias:
X-ray spectroscopy > Congresses.
Descripción
Descripción Física:xv, 475 p. : il. ; 27 cm.
ISSN:0168-583X ;

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