New trends in ion beam processing of materials and beam induced nanometric phenomena : proceedings of Symposium I on New Trends in Ion Beam Processing of Materials, and proceedings of Symposium K on Nanometric Phenomena Induced by Laser, Ion, and Cluster Beams of the 1996 E-MRS Spring Conference, Strasbourg, France, June 4-7, 1996 /

New trends in ion beam processing of materials and beam induced nanometric phenomena : proceedings of Symposium I on New Trends in Ion Beam Processing of Materials, and proceedings of Symposium K on Nanometric Phenomena Induced by Laser, Ion, and Cluster Beams of the 1996 E-MRS Spring Conference, Strasbourg, France, June 4-7, 1996 /

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Detalles Bibliográficos
Autor principal: Symposium I on New Trends in Ion Beam Processing of Materials (1996 : Strasbourg, France)
Autor Corporativo: Symposium I on New Trends in Ion Beam Processing of Materials
Otros Autores: Priolo, F., Symposium K on Nanometric Phenomena Induced by Laser, Ion, and Cluster Beams
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam ; New York : Elsevier, c1997.
Colección:European Materials Research Society symposia proceedings ; v. 65
Materias:
Materials > Effect of radiation on > Congresses.
Ion bombardment > Congresses.
Nanostructured materials > Congresses.
Silicon > Effect of radiation on > Congresses.
Acceso en línea:Reseña
Descripción
Notas:"Reprinted from Beam interactions with materials and atoms. Nuclear instruments & methods in physics research-section B. NIM-B 120 (Symposium I0, NIM-B 122 (3) (Symposium K)"--T.p. verso.
Incluye indices.
Descripción Física:x, 321, vii p., p. [301]-609 : il. ; 29 cm.
Bibliografía:Incluye referencias bibliográficas.
ISBN:0444205012 (alk. paper)

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