Particle induced x-ray emission and its analytical applications : proceedings of the seventh International Conference on PIXE and its Analytical Applications, Padua, Italy, May 26-30, 1995 /

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Detalles Bibliográficos
Autor principal: International Conference on PIXE and its Analytical Applications (7th : 1995 : Padua, Italy)
Autor Corporativo: International Conference on PIXE and its Analytical Applications
Otros Autores: Moschini, G.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1996.
Colección:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, v. 109/110
Materias:
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245 1 0 |a Particle induced x-ray emission and its analytical applications :  |b proceedings of the seventh International Conference on PIXE and its Analytical Applications, Padua, Italy, May 26-30, 1995 /  |c editor, G. Moschini, V. Valkovic. 
260 # # |a Amsterdam :  |b North-Holland,  |c 1996. 
300 # # |a xxiii, 717 p. :  |b il. ;  |c 27 cm. 
111 2 # |a International Conference on PIXE and its Analytical Applications  |n (7th :  |d 1995 :  |c Padua, Italy) 
700 1 # |a Moschini, G. 
080 # # |a 543.422.8:061.3 
650 # 0 |a Proton-induced X-ray emission  |v Congresses. 
490 1 # |a Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms,  |v v. 109/110  |x 0168-583X ; 
504 # # |a Incluye referencias bibliográficas. 
040 # # |a IWA  |c IWA  |d OCL  |b spa  |d arbccab 
500 # # |a Incluye índice. 
942 # # |c BK 
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