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|a 44th international field emission symposium :
|b 7-11 July 1997, Tsukuba, Japan /
|c Guest editors, K. Hono [and] M. Tsukada.
|
260 |
# |
# |
|a Oxford, UK :
|b Elsevier Science,
|c 1998.
|
300 |
# |
# |
|a viii, 168 p. :
|b fig.
|
504 |
# |
# |
|a Incluye referencias bibliográficas e índices.
|
111 |
2 |
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|a International field emission symposium
|n (44th :
|d 1997 :
|c Tsukuba, Japan)
|
080 |
# |
# |
|a 537.534.35:061.3
|
650 |
# |
7 |
|a Field ion microscopy
|2 inist
|
650 |
# |
7 |
|a Congresses.
|2 inist
|
650 |
# |
7 |
|a Congresos.
|2 inist
|
700 |
1 |
# |
|a Everett, R. K.,
|e ed.
|4 edt
|
700 |
1 |
# |
|a Ghosh, S.,
|e ed.
|4 edt
|
700 |
1 |
# |
|4 edt
|
490 |
1 |
# |
|a Materials science & engineering,
|v v. 250, no. 1
|x 0921-5093 ;
|
040 |
# |
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|a arbccab
|b spa
|
942 |
# |
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|c BK
|
952 |
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|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 013594_nuevo-0
|o MATER. SCI. ENG. A 1998
|p 013594_nuevo-0
|t 1
|y BK
|