Defect and microstructure analysis by diffraction /
Guardado en:
| Autor principal: | |
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| Otros Autores: | , |
| Formato: | Libro |
| Lenguaje: | |
| Publicado: |
Oxford ; New York :
Oxford University Press,
1999.
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| Colección: | International Union of Crystallography monographs on crystallography ;
10 |
| Materias: | |
| Acceso en línea: | Reseña Indice. |
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| 005 | 20090804121353.0 | ||
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| 245 | 1 | 0 | |a Defect and microstructure analysis by diffraction / |c Robert L. Snyder, Jaroslav Fiala, and Hans J. Bunge. |
| 260 | # | # | |a Oxford ; |a New York : |b Oxford University Press, |c 1999. |
| 300 | # | # | |a xxii, 785 p. : |b il. ; |c 24 cm. |
| 504 | # | # | |a Incluye referencias bibliográficas e índice. |
| 020 | # | # | |a 0198501897 (Hbk : acid-free paper) |
| 100 | 1 | # | |a Snyder, R. L. |q (Robert L.), |d 1941- |
| 700 | 1 | # | |a Fiala, Jaroslav. |
| 700 | 1 | # | |a Bunge, H.-J. |q (Hans Joachim) |
| 080 | # | # | |a 548 |
| 650 | # | 0 | |a Crystals |x Defects |x Analysis. |
| 650 | # | 0 | |a Diffraction. |
| 650 | # | 0 | |a X-ray crystallography. |
| 650 | # | 7 | |a Cristales |x Defectos. |2 inist |
| 650 | # | 7 | |a Difracción |2 inist |
| 650 | # | 7 | |a Análisis químico estructural |2 inist |
| 010 | # | # | |a ###99028971# |
| 050 | 0 | 0 | |a QD945 |b .S58 1999 |
| 490 | 1 | # | |a International Union of Crystallography monographs on crystallography ; |v 10 |
| 040 | # | # | |a DLC |c DLC |d DLC |d arbccab |b spa |d arbccab |
| 856 | 4 | 2 | |3 Reseña |u http://www.loc.gov/catdir/enhancements/fy0606/99028971-d.html |
| 856 | 4 | 1 | |3 Indice. |u http://www.loc.gov/catdir/enhancements/fy0606/99028971-t.html |
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| 952 | # | # | |2 udc |a ARBCCAB |b ARBCCAB |i 19285 |o 548 S91 |p 19285 |t 1 |y BK |
