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00787nam#a2200265#a#4500 |
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20170331153641 |
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980727s1987 xxu|||| ||||||||| ||eng d |
020 |
# |
# |
|a 0486653625
|
040 |
# |
# |
|a OEO
|b spa
|c OEO
|
080 |
# |
# |
|a 537.311.1=2
|
092 |
# |
# |
|c FOMEC 537.311.1=2 B636
|
100 |
0 |
# |
|a Blakemore, John Sydney,
|d 1927-
|
245 |
1 |
0 |
|a Semiconductor statistics.
|
260 |
# |
# |
|a New York :
|b Dover Publications,
|c 1987.
|
300 |
# |
# |
|a xviii, 381 p. ;
|c 21 cm.
|
500 |
# |
# |
|a Bibliografía: p. 366-373.
|
653 |
# |
# |
|a semiconductores
|
653 |
# |
# |
|a métodos estadísticos
|
653 |
# |
# |
|a movimiento electrones
|
653 |
# |
# |
|a sólidos
|
907 |
# |
# |
|a MONOGRAF
|
952 |
# |
# |
|f FOMEC
|g $ 12.95
|p OEO52219
|t ej.1
|a OEO
|b OEO
|o FOMEC 537.311.1=2 B636
|5 2
|y IMP
|w 19980727
|
999 |
# |
# |
|a HINTZE, S.
|