Computer-assisted microscopy : the measurement and analysis of images /

Computer-assisted microscopy : the measurement and analysis of images /

Guardado en:

Detalles Bibliográficos
Autor principal:	Russ, John C.
Formato:	Libro
Lenguaje:
Publicado:	New York : Plenum Press, c1990.
Materias:	Image processing. Microscopy > Data processing. Optical pattern recognition.

Ejemplares similares

Recognition of patterns : using the frequencies of occurrence of binary words /
por: Becker, Peter W.
Publicado: (c1978.)

Pattern recognition /
por: Bongard, M. M.
Publicado: ([1970])

Handbook of fingerprint recognition
por: Maltoni, Davide.
Publicado: (c2003.)

Proceedings of IEEE Workshop on Expert Systems and Pattern Analysis : October 31, 1986, Paris, France /
por: IEEE Workshop on Expert Systems and Pattern Analysis (1986 : Paris, France)
Publicado: (c1987.)

IEEE transactions on pattern analysis and machine intelligence.

Pattern recognition and machine learning /
por: Bishop, Christopher M.
Publicado: (2006.)

Advances in visual form analysis : proceedings of the Third International Workshop on Visual Form, Capri, Italy, May 28-30, 1997 /
por: International Workshop on Visual Form (3rd : 1997 : Capri, Italy)
Publicado: (c1997.)

The image processing handbook /
por: Russ, John C.
Publicado: (c1995.)

In situ electron and tunneling microscopy of dynamic processes : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. /
por: Materials Research Society Symposium on "In Situ Electron and Tunneling Microscopy of Dynamic Processes" (1er : 1995 : Boston, Mass.)
Publicado: (c1996.)

Microscopy and analysis.
por: Microscopy and analysis (Americas ed.)

Diffraction and imaging techniques in material science /
Publicado: (1978.)

Fundamentals of light microscopy and electronic imaging /
por: Murphy, Douglas B.
Publicado: (c2001.)

Advanced computing in electron microscopy /
por: Kirkland, Earl J.
Publicado: (c1998.)

Light and video microscopy /
por: Wayne, Randy.
Publicado: (c2009.)

International journal of pattern recognition and artificial intelligence.
Publicado: (1987-)

Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.)

Neural networks for applied sciences and engineering : from fundamentals to complex pattern recognition /
por: Samarasinghe, Sandhya.
Publicado: (c2007.)

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) /
Publicado: (1977.)

Electron microscopy and analysis /
por: Goodhew, Peter J.
Publicado: (c2001.)

Electron microscopy and strength of crystals : proceedings of the First Berkeley International Materials Conference 'The impact of transmission electron microscopy on theories of the strength of crystals' /
por: Berkeley International Materials Conference (1st : 1961 : Berkeley)
Publicado: (1963.)

Field-ion microscopy /
por: Hren, John J.
Publicado: (1968.)

Elastic and inelastic scattering in electron diffraction and imaging /
por: Wang, Zhong Lin.
Publicado: (c1995.)

Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
Publicado: (c2015.)

IEEE transactions on image processing : a publication of the IEEE Signal Processing Society.
Publicado: (1992-)

Electron microscopy in material science /
por: International School of Electron Microscopy (1970 : Erice, Italy)
Publicado: (1971.)

Optical measurements for scientists and engineers : a practical guide /
por: McClelland, Arthur,
Publicado: (c2018.)

Comisionamiento de filtros moduladores de radioterapia mediante placas radiográficas /
por: Simon Primo, Joseph Nicolás.
Publicado: (2007.)

Scanning probe microscopy.
por: International Colloquium on Scanning Probe Microscopy (16h : 2008 : Atagawa Heights, Higashi-izu, Japan)
Publicado: (2009.)

Scanning probe microscopy /
por: International Colloquium on Scanning Probe Microscopy (8th : 2000 : Shizuoka-ken, Japan)
Publicado: (c2001.)

Advances in acoustic microscopy /
Publicado: (<c1995-)

Journal of the Optical Society of America. A, Optics and image science.
Publicado: (1984-c1993.)

Transmission electron microscopy of materials /
por: Thomas, Gareth, 1932-
Publicado: (c1979.)

Handbook of microscopy : applications in materials science, solid-state physics, and chemistry /
Publicado: (c1997.)

Handbook of medical imaging : Volume 2. Medical image processing and analysis /
Publicado: (c2000.)

Medical image processing : techniques and applications /
Publicado: (c2011.)

International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 /
por: International Symposium on In-situ Electron Microscopy (2003 : Nagoya-shi, Japan)
Publicado: (c2004.)

Acoustical imaging /
por: International Symposium on Acoustical Imaging (21st : 1994 : Laguna Beach, Calif.)
Publicado: (c1995?)

Transmission electron microscopy : physics of image formation and microanalysis /
por: Reimer, Ludwig, 1928-
Publicado: (c1997.)

Introduction to electron microscopy /
por: Hall, Cecil Edwin, 1912-1991.
Publicado: (1966.)

Acoustic microscopy /
por: Briggs, Andrew.
Publicado: (1992.)