Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

Guardado en:

Detalles Bibliográficos
Autor principal:	Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.)
Autor Corporativo:	Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Otros Autores:	Passaglia, Elio, ed., Stromberg, Robert R., ed., Kruger, Jerome, ed.
Formato:	Libro
Lenguaje:	Inglés
Publicado:	Washington : U.S. National Bureau of Standards, 1964.
Colección:	United States. National Bureau of Standards. Miscellaneous publication ; 256.
Materias:	Polarization (Light) Surfaces (Technology) Thin films.

Para reservar material debe primero ingresar al sistema

Instituto Balseiro

Inventario	Ej.	Ubicación	Disponibilidad	Estado de Circulación
8566	1	539.23:061.3 S68 1963	Sala	Disponible