Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

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Detalles Bibliográficos
Autor principal: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.)
Autor Corporativo: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Otros Autores: Passaglia, Elio, ed., Stromberg, Robert R., ed., Kruger, Jerome, ed.
Formato: Libro
Lenguaje:
Publicado: Washington : U.S. National Bureau of Standards, 1964.
Colección:United States. National Bureau of Standards. Miscellaneous publication ; 256.
Materias:
Polarization (Light)
Surfaces (Technology)
Thin films.
Descripción
Notas:Edited by E. Passaglia, R.R. Strombery, and J. Kruger.
Descripción Física:vi, 359 p. : il. ; 24 cm.
Bibliografía:Incluye referencias bibliográficas.

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