Frontiers of electron microscopy in materials science : proceedings of the sixth Conference on Frontiers in Electron Microscopy in Materials Science, Oak Brook, Illinois, USA, 4-7 June 1996.

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Detalles Bibliográficos
Autor principal: Conference on Frontiers of Electron Microscopy in Materials Science (6th : 1996 : Oak Brook, Ill.)
Autor Corporativo: Conference on Frontiers of Electron Microscopy in Materials Science
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : Elsevier Science, c1997.
Colección:Ultramicroscopy, v. 67, no. 1-4
Materias:
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245 1 0 |a Frontiers of electron microscopy in materials science :  |b proceedings of the sixth Conference on Frontiers in Electron Microscopy in Materials Science, Oak Brook, Illinois, USA, 4-7 June 1996. 
260 # # |a Amsterdam :  |b Elsevier Science,  |c c1997. 
300 # # |a vii, 238 p. :  |b il. ;  |c 27 cm. 
111 2 # |a Conference on Frontiers of Electron Microscopy in Materials Science  |n (6th :  |d 1996 :  |c Oak Brook, Ill.) 
650 # 0 |a Materials  |x Analysis  |v Congresses. 
650 # 0 |a Materials science  |v Congresses. 
650 # 0 |a Electron microscopy  |v Congresses. 
049 # # |a AR5A 
490 1 # |a Ultramicroscopy,  |v v. 67, no. 1-4  |x 0304-3991 ; 
504 # # |a Incluye referencias bibliográficas. 
040 # # |a IWA  |c IWA  |d OCL  |b spa  |d arbccab 
500 # # |a "The sixth Conference on Frontiers of Electron Microscopy in Materials Science"--Foreword. 
500 # # |a Edited by: Stevan A. Bradley, Charles W. Allen, Wayne E. King. 
500 # # |a Incluye indices. 
942 # # |c BK 
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