SPM '99 : proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 /

SPM '99 : proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 /

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Detalles Bibliográficos
Autor principal:	International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures (1st : 1999 : Seattle)
Autor Corporativo:	International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures
Otros Autores:	Hörber, J. K. Heinrich.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam : Elsevier, 2000.
Materias:	Scanning probe microscopy > Congresses. Detectors > Congresses. Nanostructures > Congresses.

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