Papers presented at the Ninth International Conference on Defects : Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001 /

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Detalles Bibliográficos
Autor principal: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (9th : 2001 : Rimini, Italy)
Autor Corporativo: International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
Otros Autores: Frigeri, C.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : Elsevier, c2002.
Colección:Materials science & engineering. B, Solid-state materials for advanced technology ; v. B91-92 (30 Apr. 2002).
Materias:
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245 1 0 |a Papers presented at the Ninth International Conference on Defects :  |b Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001 /  |c [guest editor, C. Fregeri]. 
260 # # |a Amsterdam :  |b Elsevier,  |c c2002. 
300 # # |a xii, 559 p. :  |b il. (some col.) ;  |c 28 cm. 
111 2 # |a International Conference on Defects: Recognition, Imaging and Physics in Semiconductors  |n (9th :  |d 2001 :  |c Rimini, Italy) 
700 1 # |a Frigeri, C.  |q (Cesare) 
246 3 0 |a Ninth International Conference on Defects :  |b Recognition, Imaging and Physics in Semiconductors 
246 3 # |a DRIP-IX 
650 # 0 |a Semiconductors  |x Defects  |v Congresses. 
490 1 # |a Materials science & engineering. B, Solid-state materials for advanced technology ;  |v v. B91-92 (30 Apr. 2002). 
504 # # |a Incluye referencias bibliográficas. 
040 # # |a HNK  |c HNK  |d OCLCQ  |b spa  |d arbccab 
500 # # |a "Special issue."--Cover. 
500 # # |a Incluye indices. 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008449_nuevo-0  |o MATER. SCI. ENG. B 2002  |p 008449_nuevo-0  |t 1  |y BK