Particle induced x-ray emission and its analytical applications 3 : proceedings of the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Fed. Rep. Germany, July 18-22, 1983 /

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Detalles Bibliográficos
Autor principal: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (3rd : 1983 : Heidelberg, Germany)
Autor Corporativo: International Conference on Particle Induced X-ray Emission and Its Analytical Applications
Otros Autores: Martin, Bernd.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland Physics Pub., 1984.
Colección:Nuclear instruments & methods in physics research. Section B. Beam interactions with materials and atoms ; v. 231 [B2] (1984)
Materias:
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245 1 0 |a Particle induced x-ray emission and its analytical applications 3 :  |b proceedings of the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Fed. Rep. Germany, July 18-22, 1983 /  |c editor, Bernd Martin. 
260 # # |a Amsterdam :  |b North-Holland Physics Pub.,  |c 1984. 
300 # # |a xix, 712 p. :  |b il. ;  |c 27 cm. 
490 1 # |a Nuclear instruments & methods in physics research. Section B. Beam interactions with materials and atoms ;  |v v. 231 [B2] (1984) 
111 2 # |a International Conference on Particle Induced X-ray Emission and Its Analytical Applications  |n (3rd :  |d 1983 :  |c Heidelberg, Germany) 
700 1 # |a Martin, Bernd. 
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650 # 0 |a X-ray spectroscopy  |v Congresses. 
050 # 4 |a QD96.X2  |b P37 1983 
504 # # |a Incluye referencias bibliográficas. 
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