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|a Quantitative X-ray diffractometry /
|c Lev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.
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| 260 |
# |
# |
|a New York :
|b Springer,
|c c1995.
|
| 300 |
# |
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|a xvii, 372 p. :
|b il. ;
|c 25 cm.
|
| 020 |
# |
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|a 0387945415 (hc : alk. paper)
|
| 100 |
1 |
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|a Zevin, Lev S.
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| 700 |
1 |
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|a Kimmel, Giora.
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| 700 |
1 |
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|a Mureinik, Inez.
|
| 650 |
# |
0 |
|a X-rays
|x Diffraction.
|
| 650 |
# |
0 |
|a X-rays
|x Diffraction
|x Industrial applications.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas (p. 355-364) e índice.
|
| 040 |
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|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
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| 500 |
# |
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|a Incluye índice.
|
| 082 |
0 |
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|a 545/.81
|2 20
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| 942 |
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|c BK
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| 952 |
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|2 udc
|a ARBCCAB
|b ARBCCAB
|i 16505
|o 548.73 Z6
|p 16505
|t 1
|y BK
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