$Quantitative X-ray diffractometry /$

Quantitative X-ray diffractometry /

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Detalles Bibliográficos
Autor principal:	Zevin, Lev S.
Otros Autores:	Kimmel, Giora., Mureinik, Inez.
Formato:	Libro
Lenguaje:
Publicado:	New York : Springer, c1995.
Materias:	X-rays > Diffraction. X-rays > Diffraction > Industrial applications.

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