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20061017165218.0 |
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BCCAB012381 |
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AR-BCCAB |
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|a Defect processes induced by electronic excitation in insulators /
|c edited by Noriaki Itoh.
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| 260 |
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|a Singapore :
|b World Scientific,
|c c1989.
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| 300 |
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|a 280 p.
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| 504 |
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|a Incluye referencias bibliográficas e índice.
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|a 9971503514
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| 700 |
1 |
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|a Itoh, Noriaki.
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| 040 |
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|a arbccab
|b spa
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| 856 |
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|u http://campi.cab.cnea.gov.ar/tocs/18602.pdf
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| 942 |
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|c BK
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| 952 |
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|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20030111
|i 18602
|o 5838.9
|p 18602
|t 1
|y BK
|
