Proceedings of the 5th topical conference on high temperature plasma diagnostics : 16-20 September 1984, Tahoe City, California /

Proceedings of the 5th topical conference on high temperature plasma diagnostics : 16-20 September 1984, Tahoe City, California /

Guardado en:

Detalles Bibliográficos
Autor principal:	Topical conference on high temperature plasma diagnostics (1984 : Tahoe City, California )
Autor Corporativo:	Topical conference on high temperature plasma diagnostics
Formato:	Sin ejemplares
Lenguaje:
Publicado:	New York : American Institute of Physics, 1984.
Colección:	Review of Scientific Instruments ; v. 56, no. 5, P. II
Materias:	Spectroscopy Espectroscopia X radiation Radiacion rayos x Congresses. Congresos.

Ejemplares similares

Proceedings of the sixth topical conference on high temperature plasma diagnostics : Hilton Head Island, South Carolina, 9-13 March 1986. /
por: Topical conference on high temperature plasma diagnostics (1986 : Hilton Head Island, South Carolina)
Publicado: (1986.)

X-ray studies of materials /
por: Guinier, André.
Publicado: (1963.)

XAFS V : proceedings of the Fifth International Conference on X-Ray Absorption Fine Structure, held in Seattle, WA, USA on August 21-26, 1988 /
por: International Conference on X-Ray Absorption Fine Structure (5th : 1988 : Seattle, Wash., U.S.)
Publicado: (1989.)

Gamma and x-ray spectrometry with semiconductor detectors /
por: Debertin, Klaus.
Publicado: (c1988.)

X-ray spectrometry in electron beam instruments /
Publicado: (c1995.)

Análisis por técnicas de rayos X SARX III
por: Seminario de Análisis por Técnicas de Rayos X SARX III (3 : 1980, octubre : La Plata, Argentina).
Publicado: (1980.)

Teoría y práctica de la espectroscopía de rayos X
por: Bermúdez Polonio, J.
Publicado: (c1967.)

Rayons X et matière : RX 2001 : colloque dédié à la mémoire d'André Guinier : ENSAIS, École nationale supérieure des arts et industries, Strasbourg, France, 9-11 décembre 2003 /
por: RX 2001 (5th : 2003 : Strasbourg, France)
Publicado: (2002.)

Rayons X et matière : RX 97 : (ENSAIS) Ecole nationale supérieure des arts et industries, Strasbourg, 14-16 octobre 1997 /
por: Colloque Rayons X et Matiere (2nd : 1997 Oct. : Strasbourg, France)
Publicado: ([1998])

Rayons X et matière : RX 99, ENSAIS, École National Supérieure des Arts et Industries, Strasbourg, France, 7-10 décembre 1999 /
por: Ecole Nationale Supérieure des Arts et Industries (RX99 (1999 Dec. 7-10 : Strasbourg, France)
Publicado: ([2000])

The development of x-ray analysis.
por: Bragg, William Lawrence, 1890-1975
Publicado: (1992.)

Excitación electrónica en espectros de fotoemisión de argon y potasio implantados en aluminio /
por: Abbate, Miguel.
Publicado: (1989.)

X-Ray diffraction : a practical approach /
por: Suryanarayana, C.
Publicado: (c1998.)

Radiaciones ionizantes
por: Strettan, J. S.
Publicado: (c1967.)

X-ray diffraction procedures for polycrystalline and amorphous materials /
por: Klug, Harold P.
Publicado: ([1974])

Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /
por: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (2nd : 1980 : Lund, Sweden)
Publicado: (1981.)

Particle induced x-ray emission and its analytical applications 3 : proceedings of the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Fed. Rep. Germany, July 18-22, 1983 /
por: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (3rd : 1983 : Heidelberg, Germany)
Publicado: (1984.)

Particle induced x-ray emission and its analytical applications : proceedings of the Fourth International Conference on Particle Induced X-ray Emission and its Analytical Applications, Tallahassee, FL, USA, June 9-13, 1986 /
por: International Conference on Particle Induced X-ray Emission and its Analytical Applications (4th : 1986 : Tallahassee, Fla.)
Publicado: (1987.)

Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /
por: International Conference on Particle Induced X-Ray Emission and its Analytical Applications (5th : 1989 : Amsterdam, Netherlands)
Publicado: (1990.)

X-ray spectroscopy /
por: Azároff, Leonid V.
Publicado: ([1973, c1974])

Automatización defractómetro de rayos X. /
por: Dutrús, Marcelo A.
Publicado: (1994.)

Elements of x-ray diffraction /
por: Cullity, B. D.
Publicado: (c2014.)

Mathematical theory of X-ray powder diffractometry /
por: Wilson, A. J. C. 1914-1995.
Publicado: (1963.)

Band structure spectroscopy of metals and alloys /
Publicado: (1973.)

Introduction to X-ray powder diffractometry /
por: Jenkins, Ron, 1932-
Publicado: (c1996.)

Rayos Roentgen : técnica del roentgendiagnóstico
por: Brachetta, Victorio
Publicado: (1939.)

The rays : a history of radiology in the United States and Canada
por: Brecher, Ruth
Publicado: (c1969.)

X-ray diffraction by polycrystalline materials /
por: Peiser, H. Steffen 1917-
Publicado: (1955.)

The Rietveld method /
Publicado: (1993.)

The interpretation of X-ray diffraction photographs /
por: Henry, N. F. M.
Publicado: (1953.)

Proceedings of the 13th Topical Conference on High-Temperature Plasma Diagnostics : 18-22 June 2000, Tuscon, Arizona /
por: Topical Conference on High Temperature Plasma Diagnostics (13th : 2000 : Tucson, Ariz.)
Publicado: (c2001.)

Desarrollo y aplicaciones de detectores de radiación basados en sensores de imagen CMOS comerciales /
por: Pérez, Martín.
Publicado: (2021.)

Manual de radioscopia /
por: Mora Chamorro, Héctor.
Publicado: (2013)

X-ray diffraction /
por: Warren, B. E. 1902-1991.
Publicado: (1990.)

Multiple diffraction of x-rays in crystals /
por: Chang, Shih-Lin, 1946-
Publicado: (1984.)

X-ray optics : the diffraction of X-rays by finite and imperfect crystals /
por: Wilson, A. J. C. 1914-1995.
Publicado: ([1949])

Quantitative X-Ray diffraction determination of alfa-Lactose monohydrate and beta-Lactose in chocolate
por: Thomas, Nathan R.

Aspectos estructurales del complejo de plata (I) con el ligando 1,1-diisobutil-3-benzoiltioúrea
por: Angulo-Cornejo, J.

Manual práctico sobre el uso de los rayos x en medicina y odontología y el control de los peligros de la radiación /
por: Chamberlain, Richard H.
Publicado: (c1960.)

Diagnóstico radiológico : complemento radiológico del tratado de medicina interna de Beeson y Medermott /
por: Teplick, J. George
Publicado: (c1979.)