Particle-induced X-ray emission spectrometry (PIXE) /

Particle-induced X-ray emission spectrometry (PIXE) /

Guardado en:

Detalles Bibliográficos
Otros Autores:	Johansson, Sven A. E., 1923-, Campbell, John L., Malmqvist, Klas G.
Formato:	Libro
Lenguaje:
Publicado:	New York : Wiley, c1995.
Colección:	Chemical analysis ; v. 133
Materias:	Proton-induced X-ray emission.
Acceso en línea:	Información biográfica Reseña Indice Indice.

Ejemplares similares

Particle induced x-ray emission and its analytical applications : proceedings of the eighth International Conference on PIXE and its Analytical Applications, Lund, Sweden, June 14-18, 1998 /
por: International Conference on PIXE and its Analytical Applications (8th : 1998 : Lund, Sweden)
Publicado: (1999.)

Particle induced x-ray emission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo, Japan, July 20-24, 1992 /
por: International Conference on PIXE and its Analytical Applications (6th : 1992 : Tokyo, Japan)
Publicado: (1993.)

Particle induced x-ray emission and its analytical applications : proceedings of the seventh International Conference on PIXE and its Analytical Applications, Padua, Italy, May 26-30, 1995 /
por: International Conference on PIXE and its Analytical Applications (7th : 1995 : Padua, Italy)
Publicado: (1996.)

Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /
por: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (2nd : 1980 : Lund, Sweden)
Publicado: (1981.)

Particle induced x-ray emission and its analytical applications : proceedings of the Fourth International Conference on Particle Induced X-ray Emission and its Analytical Applications, Tallahassee, FL, USA, June 9-13, 1986 /
por: International Conference on Particle Induced X-ray Emission and its Analytical Applications (4th : 1986 : Tallahassee, Fla.)
Publicado: (1987.)

Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /
por: International Conference on Particle Induced X-Ray Emission and its Analytical Applications (5th : 1989 : Amsterdam, Netherlands)
Publicado: (1990.)

Particle induced x-ray emission and its analytical applications 3 : proceedings of the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Fed. Rep. Germany, July 18-22, 1983 /
por: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (3rd : 1983 : Heidelberg, Germany)
Publicado: (1984.)

Advances in x-ray analysis. proceedings of the twentieth annual Conference on Applications of X-Ray Analysis, held August 11-13, 1971 / Volume 15 :
Publicado: (1972.)

Quantitative X-ray diffractometry /
por: Zevin, Lev S.
Publicado: (c1995.)

X-ray diffraction /
Publicado: ([1974])

X-rays /
Publicado: (1957.)

X-Ray diffraction : a practical approach /
por: Suryanarayana, C.
Publicado: (c1998.)

Gamma and x-ray spectrometry with semiconductor detectors /
por: Debertin, Klaus.
Publicado: (c1988.)

X-rays in practice /
por: Sproull, Wayne Treber, 1906-
Publicado: (1946.)

Applied X-rays /
por: Clark, George L. 1892-1969.
Publicado: (1955.)

Data for X-ray analysis /
por: Parrish, W.
Publicado: (1953.)

Elements of X-ray diffraction. /
por: Cullity, B. D.
Publicado: ([1956])

Elements of x-ray diffraction /
por: Cullity, B. D.
Publicado: (c1978.)

X-rays and their applications /
por: Brown, James Graham.
Publicado: (1975, c1966.)

X-ray spectroscopy /
por: Azároff, Leonid V.
Publicado: ([1973, c1974])

Diffuse X-ray reflections from crystals /
por: Wooster, W. A.
Publicado: (1962.)

An introduction to X-ray metallography /
por: Taylor, Abraham.
Publicado: (1952.)

X-ray crystal structure. /
por: McLachlan, Dan, 1905-
Publicado: (1957.)

X-ray diffraction procedures for polycrystalline and amorphous materials /
por: Klug, Harold P. 1902-
Publicado: ([1954])

X-ray diffraction procedures for polycrystalline and amorphous materials /
por: Klug, Harold P.
Publicado: ([1974])

Small-angle scattering of X-rays /
por: Guinier, André.
Publicado: (1955.)

Structure determination by X-ray crystallography /
por: Ladd, M. F. C.
Publicado: (c1977.)

International tables for X-ray crystallography. /
Publicado: (1967-1969.)

X-ray lasers 2000 : 7th International Conference on X-ray Lasers, Saint-Malo, France, June 19-23, 2000 /
por: International Conference on X-ray Lasers (7th : 2000 : Saint-Malo, France)
Publicado: ([2001])

X-ray crystallographic technology /
por: Guinier, André.
Publicado: (1952.)

X-ray diffraction methods /
por: Nuffield, E. W.
Publicado: ([1966])

X-ray crystallography : an introduction to the investigation of crystals by their diffraction of monochromatic X-radiation /
por: Buerger, Martin Julian, 1903-1986.
Publicado: (1942.)

X-ray spectrometry in electron beam instruments /
Publicado: (c1995.)

Modern X-ray analysis on single crystals /
por: Luger, Peter, 1943-
Publicado: (1980.)

Local atomic arrangements studied by X-ray diffraction /
Publicado: ([1966])

Elements of x-ray diffraction /
por: Cullity, B. D.
Publicado: (c2014.)

X-ray protection design /
por: Wyckoff, Harold O. 1910-1999.
Publicado: (1952.)

International Colloquium on X-ray Lasers = Colloque international sur les lasers rayons X : April 14-17, 1986, Aussois, France /
por: International Colloquium on X-ray Lasers (1986 : Aussois, France)
Publicado: (1986.)

X-ray structure determination : a practical guide /
por: Stout, George H., 1932-
Publicado: (c1989.)

ERDA Symposium on X-and Gamma-ray Sources and Applications, University of Michigan, May 19-21, 1976. : Proceedings.
Publicado: ([1976])