Introduction to electron microscopy /

Introduction to electron microscopy /

Guardado en:

Detalles Bibliográficos
Autor principal:	Hall, Cecil Edwin, 1912-1991.
Formato:	Libro
Lenguaje:
Publicado:	New York : McGraw-Hill, 1966.
Edición:	2d ed.
Colección:	International series in pure and applied physics
Materias:	Electron microscopy. Microsocopia electrónica.

Ejemplares similares

Electron microscopy and analysis /
por: Goodhew, Peter J.
Publicado: (c2001.)

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
por: Egerton, R. F.
Publicado: (c2005.)

Principles of analytical electron microscopy /
Publicado: (c1986.)

Fundamentals of transmission electron microscopy /
por: Heidenreich, Robert D.
Publicado: (1964.)

Introduction to conventional transmission electron microscopy /
por: De Graef, Marc.
Publicado: (2003.)

Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.)

Electron microscopy and strength of crystals : proceedings of the First Berkeley International Materials Conference 'The impact of transmission electron microscopy on theories of the strength of crystals' /
por: Berkeley International Materials Conference (1st : 1961 : Berkeley)
Publicado: (1963.)

High-resolution electron microscopy /
por: Spence, John C. H.
Publicado: (2003.)

Advanced computing in electron microscopy /
por: Kirkland, Earl J.
Publicado: (c1998.)

Thin foil preparation for electron microscopy /
por: Goodhew, Peter J.
Publicado: (1985.)

Electron microscopy of thin crystals /
por: Hirsch, P. B.
Publicado: (1965.)

Electron microscopy in material science /
por: International School of Electron Microscopy (1970 : Erice, Italy)
Publicado: (1971.)

Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
Publicado: (c2015.)

Transmission electron microscopy : physics of image formation and microanalysis /
por: Reimer, Ludwig, 1928-
Publicado: (c1997.)

Energy-filtering transmission electron microscopy /
Publicado: (c1995.)

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) /
Publicado: (1977.)

Transmission electron microscopy of materials /
por: Thomas, Gareth, 1932-
Publicado: (c1979.)

International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 /
por: International Symposium on In-situ Electron Microscopy (2003 : Nagoya-shi, Japan)
Publicado: (c2004.)

Sample preparation handbook for tranmission electron microscopy : techniques /
por: Ayache, Jeanne.
Publicado: (2010.)

Sample preparation handbook for tranmission electron microscopy : methodology /
por: Ayache, Jeanne.
Publicado: (2010.)

Transmission electron microscopy : a textbook for materials science /
por: Williams, David B. 1949-
Publicado: (c1996, 2009.)

Transmission electron microscopy : a textbook for materials science /
por: Williams, David B. 1949-
Publicado: (c1996.)

Reflection electron microscopy and spectroscopy for surface analysis /
por: Wang, Zhong Lin.
Publicado: (1996.)

Advanced scanning electron microscopy and X-ray microanalysis /
Publicado: (c1986.)

High-resolution transmission electron microscopy and associated techniques /
Publicado: (1988.)

Electron microscopy and microanalysis of crystalline materials /
Publicado: (c1979.)

The Application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988 /
Publicado: (1989.)

Electron microscopy in solid state physics /
Publicado: (1987.)

Introduction to electron microscopy /
por: Hall, Cecil E.
Publicado: (1983.)

Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A. /
Publicado: (c1992.)

Electron microscope specimen preparation techniques in materials science /
por: Thompson-Russell, K. C.
Publicado: (1977.)

Frontiers of electron microscopy in materials science : proceedings of the sixth Conference on Frontiers in Electron Microscopy in Materials Science, Oak Brook, Illinois, USA, 4-7 June 1996.
por: Conference on Frontiers of Electron Microscopy in Materials Science (6th : 1996 : Oak Brook, Ill.)
Publicado: (c1997.)

Recent advances in electron and light optical imaging in biology and medicine /
Publicado: (1986.)

Electron microprobe analysis and scanning electron microscopy in geology /
por: Reed, S. J. B.
Publicado: (1996.)

Scanning electron microscopy and x-ray microanalysis /
Publicado: (c2003.)

Electron energy-loss spectroscopy in the electron microscope /
por: Egerton, R. F.
Publicado: (c1996.)

Transmission electron microscopy and diffractometry of materials /
por: Fultz, B.
Publicado: (c2002.)

Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists /
Publicado: (c1992.)

Fundamentals of light microscopy and electronic imaging /
por: Murphy, Douglas B.
Publicado: (c2001.)

Electron beam analysis of materials /
por: Loretto, M. H.
Publicado: (1994.)