Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /

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Detalles Bibliográficos
Autor principal: International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England)
Autor Corporativo: International Symposium on Defect Recognition and Image Processing in III-V Compounds
Otros Autores: Brozel, M. R. ed., Stirland, D. J. ed.
Formato: Sin ejemplares
Lenguaje:
Publicado: Bristol, England ; Philadelphia : Adam Hilger, c1992.
Colección:Semiconductor Science Technology 1992 ; v. 7, no. 1A
Materias:
Semiconductors > Defects > Congresses.
Photoluminescence > Congresses.
Gallium arsenide semiconductors > Congresses.
Descripción
Descripción Física:310 p. : il. (algunbas col.) ; 31 cm.
Bibliografía:Incluye referencias bibliográficas.

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