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| 008 |
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| 005 |
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| 001 |
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| 245 |
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|a Defect recognition in semiconductors before and after processing :
|b proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /
|c edited by M.R. Brozel, D.J. Stirland.
|
| 260 |
# |
# |
|a Bristol, England ;
|a Philadelphia :
|b Adam Hilger,
|c c1992.
|
| 300 |
# |
# |
|a 310 p. :
|b il. (algunbas col.) ;
|c 31 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 111 |
2 |
# |
|a International Symposium on Defect Recognition and Image Processing in III-V Compounds
|n (4th :
|d 1991 :
|c Wilmslow, England)
|
| 650 |
# |
0 |
|a Semiconductors
|x Defects
|v Congresses.
|
| 650 |
# |
0 |
|a Photoluminescence
|v Congresses.
|
| 650 |
# |
0 |
|a Gallium arsenide semiconductors
|v Congresses.
|
| 700 |
1 |
# |
|a Brozel, M. R.
|q (Michael R.),
|e ed.
|4 edt
|
| 700 |
1 |
# |
|a Stirland, D. J.
|q (Derek J.),
|e ed.
|4 edt
|
| 490 |
1 |
# |
|a Semiconductor Science Technology 1992 ;
|v v. 7, no. 1A
|
| 040 |
# |
# |
|a DLC
|c DLC
|d OCL
|d BAKER
|b spa
|d arbccab
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
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|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 008747_nuevo-0
|o SEMICONDUCTOR SCI. TECHNOL. 1992
|p 008747_nuevo-0
|t 1
|y BK
|
