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| LEADER |
01295cam#a2200289ua#4500 |
| 008 |
000110s1999####ne#a##########101#0#eng#d |
| 005 |
20060802142501.0 |
| 001 |
BCCAB009377 |
| 003 |
AR-BCCAB |
| 245 |
1 |
0 |
|a Proceedings of the 20th International Conference on Defects in Semiconductors :
|b ICDS-20 held in Berkeley, CA, USA, 26-30 July 1999 /
|c guest editors, Chris Van de Walle, Wladek Walukiewicz.
|
| 260 |
# |
# |
|a Amsterdam :
|b Elsevier,
|c c1999.
|
| 300 |
# |
# |
|a xxv, 1063 p. :
|b il. ;
|c 27 cm.
|
| 111 |
2 |
# |
|a International Conference on Defects in Semiconductors
|n (20th :
|d 1999 :
|c Berkeley, Calif.)
|
| 700 |
1 |
# |
|a Van de Walle, Chris Gilbert.
|
| 700 |
1 |
# |
|a Walukiewicz, Wladek.
|
| 246 |
3 |
0 |
|a 20th International Conference on Defects in Semiconductors
|
| 246 |
3 |
# |
|a Twentieth International Conference on Defects in Semiconductors
|
| 246 |
3 |
0 |
|a International Conference on Defects in Semiconductors
|
| 246 |
3 |
0 |
|a ICDS-20
|
| 246 |
3 |
0 |
|a Defects in semiconductors
|
| 650 |
# |
0 |
|a Semiconductors
|x Defects
|v Congresses.
|
| 490 |
1 |
# |
|a Physica. B, Condensed matter ;
|v v. 273-274
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 040 |
# |
# |
|a SOE
|c SOE
|d CUS
|b spa
|d arbccab
|
| 500 |
# |
# |
|a Incluye indices.
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 009377_nuevo-0
|o PHYSICA B 1999
|p 009377_nuevo-0
|t 1
|y BK
|
