Proceedings of the 20th International Conference on Defects in Semiconductors : ICDS-20 held in Berkeley, CA, USA, 26-30 July 1999 /

Proceedings of the 20th International Conference on Defects in Semiconductors : ICDS-20 held in Berkeley, CA, USA, 26-30 July 1999 /

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Detalles Bibliográficos
Autor principal:	International Conference on Defects in Semiconductors (20th : 1999 : Berkeley, Calif.)
Autor Corporativo:	International Conference on Defects in Semiconductors
Otros Autores:	Van de Walle, Chris Gilbert., Walukiewicz, Wladek.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam : Elsevier, c1999.
Colección:	Physica. B, Condensed matter ; v. 273-274
Materias:	Semiconductors > Defects > Congresses.

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