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20061010111912.0 |
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BCCAB012166 |
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AR-BCCAB |
| 245 |
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|a Beam injection assessment of defects in semiconductors :
|b [edited by] J. Piqueras, P. Fernández and B. Méndez.
|
| 260 |
# |
# |
|a Amsterdam :
|b Elsevier,
|c 1996.
|
| 300 |
# |
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|a x, 316 p.
|b il. ;
|c 27 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 022 |
# |
# |
|a 0921-5107
|
| 111 |
2 |
# |
|a International Workshop on Beam Inection Assessment of Defects in Semiconductors
|n (4th :
|d 1996 :
|c El Escorial, Spain)
|
| 740 |
0 |
1 |
|a BIADS 96
|
| 700 |
1 |
# |
|a Piqueras, J.,
|e ed.
|4 edt
|
| 700 |
1 |
# |
|a P. Fernández,
|e ed.
|4 edt
|
| 700 |
1 |
# |
|a Méndez, B.,
|e ed.
|4 edt
|
| 490 |
1 |
# |
|a Materials Science and Engineering 1996 ;
|v B 42, nos. 1-3
|
| 040 |
# |
# |
|a MYG
|c MYG
|d OCL
|b spa
|d arbccab
|
| 500 |
# |
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|a "Containing papers presented at the 4th International Workshop on Beam Inection Assessment of Defects in Semiconductors (BIADS 96), 3-6 june 1996, El Escorial, Spain".
|
| 942 |
# |
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|c BK
|
| 952 |
# |
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|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 012166_nuevo-0
|o MATER. SCI. ENG. 1996
|p 012166_nuevo-0
|t 1
|y BK
|
