Beam injection assessment of defects in semiconductors : [edited by] J. Piqueras, P. Fernández and B. Méndez.

Beam injection assessment of defects in semiconductors : [edited by] J. Piqueras, P. Fernández and B. Méndez.

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Detalles Bibliográficos
Autor principal:	International Workshop on Beam Inection Assessment of Defects in Semiconductors (4th : 1996 : El Escorial, Spain)
Autor Corporativo:	International Workshop on Beam Inection Assessment of Defects in Semiconductors
Otros Autores:	Piqueras, J., ed., P. Fernández, ed., Méndez, B., ed.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam : Elsevier, 1996.
Colección:	Materials Science and Engineering 1996 ; B 42, nos. 1-3

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