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|a High-resolution X-ray scattering from thin films and multilayers /
|c Václav Holý, Ullrich Pietsch, Tilo Baumbach.
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| 260 |
# |
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|a Berlin ;
|a New York :
|b Springer,
|c c1999.
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| 300 |
# |
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|a xi, 256 p. :
|b il. ;
|c 25 cm.
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| 490 |
1 |
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|a Springer tracts in modern physics,
|x 0081-3869 ;
|v v. 149
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| 020 |
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|a 354062029X (hardcover : alk. paper)
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| 100 |
1 |
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|a Holý, Václav,
|d 1953-
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| 700 |
1 |
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|a Pietsch, Ullrich,
|d 1952-
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| 700 |
1 |
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|a Baumbach, Tilo,
|d 1961-
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| 650 |
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0 |
|a Thin films
|x Optical properties.
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| 650 |
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|a Thin films, Multilayered
|x Optical properties.
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| 650 |
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|a X-rays
|x Scattering.
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| 650 |
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0 |
|a X-rays
|x Diffraction.
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| 504 |
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|a Incluye referencias bibliográficas.
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| 040 |
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|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
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| 500 |
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|a Incluye índice.
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|a 539 s
|a 530.4/175
|2 21
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| 942 |
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|c BK
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|2 udc
|a ARBCCAB
|b ARBCCAB
|i 19080
|o HEMEROTECA
|p 19080
|t 1
|y BK
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