High-resolution X-ray scattering from thin films and multilayers /

High-resolution X-ray scattering from thin films and multilayers /

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Detalles Bibliográficos
Autor principal:	Holý, Václav, 1953-
Otros Autores:	Pietsch, Ullrich, 1952-, Baumbach, Tilo, 1961-
Formato:	Libro
Lenguaje:
Publicado:	Berlin ; New York : Springer, c1999.
Colección:	Springer tracts in modern physics, v. 149
Materias:	Thin films > Optical properties. Thin films, Multilayered > Optical properties. X-rays > Scattering. X-rays > Diffraction.

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