Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Detalles Bibliográficos
Autor principal:	Egerton, R. F.
Formato:	Libro
Lenguaje:
Publicado:	New York, NY : Springer, c2005.
Materias:	Electron microscopy. Microscopía electrónica.
Acceso en línea:	Indice

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