Fundamentals of nanoscale film analysis /

From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to me...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autor principal: Alford, Terry L.
Otros Autores: Feldman, Leonard C., Mayer, James W., 1930-
Formato: Libro
Lenguaje:
Publicado: New York, N.Y. ; London : Springer, c2007.
Materias:
Acceso en línea:Tapa
Indice
Descripción
Sumario:From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.
Descripción Física:xiv, 336 p. : il. ; 25 cm.
Bibliografía:Incluye referencias bibliográficas e índice.
ISBN:9781441939807
978038729261 (e-book)
0387292616 (e-book)
9780387292601