Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...
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| Formato: | Libro |
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Hackensack, NJ :
Imperial College Press,
c2015.
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| Acceso en línea: | Tapa Indice |
| Sumario: | The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. |
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| Descripción Física: | xxxiii, 571 p. : il. (some color) ; 24 cm. |
| Bibliografía: | Incluye referencias bibliográficas e índice. |
| ISBN: | 9781848167896 (hardcover : alk. paper) |
