Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...
Guardado en:
Otros Autores: | Tanaka, Nobuo, 1949- |
---|---|
Formato: | Libro |
Lenguaje: | |
Publicado: |
Hackensack, NJ :
Imperial College Press,
c2015.
|
Materias: | |
Acceso en línea: | Tapa Indice |
Ejemplares similares
-
Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.) -
Transmission electron microscopy : physics of image formation and microanalysis /
por: Reimer, Ludwig, 1928-
Publicado: (c1997.) -
Advanced scanning electron microscopy and X-ray microanalysis /
Publicado: (c1986.) -
Introduction to conventional transmission electron microscopy /
por: De Graef, Marc.
Publicado: (2003.) -
Energy-filtering transmission electron microscopy /
Publicado: (c1995.)