Microstructural characterization of materials /
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for...
Guardado en:
Autor principal: | Brandon, D. G. |
---|---|
Otros Autores: | Kaplan, Wayne D. |
Formato: | Sin ejemplares |
Lenguaje: | |
Publicado: |
Chichester, England :
John Wiley & Sons,
c2008.
|
Edición: | 2nd ed. |
Colección: | Quantitative software engineering series
|
Materias: | |
Acceso en línea: | Índice Tapa |
Ejemplares similares
-
Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.) -
Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
Publicado: (c2015.) -
Maquinado de titanio adherido a paneles de materiales compuestos /
por: Stefanuto, Guido.
Publicado: (2013.) -
Electron microscope specimen preparation techniques in materials science /
por: Thompson-Russell, K. C.
Publicado: (1977.) -
Fundamentals of transmission electron microscopy /
por: Heidenreich, Robert D.
Publicado: (1964.)