SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /

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Detalles Bibliográficos
Autor principal: International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : 2000 : Heidelberg, Germany)
Autor Corporativo: International Conference on Scanning Probe Microscopy, Sensors and Nanostructures
Otros Autores: Allison, David P.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam ; New York : Elsevier, 2001.
Colección:Ultramicroscopy ; v. 86, nos. 1/2
Materias:
LEADER 01335cam#a2200277ua#4500
008 010206s2001####ne#a#####b####100#0#eng#d
005 20060721115740.0
001 BCCAB008137
003 AR-BCCAB
245 1 0 |a SPM 2000 :  |b proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /  |c guest editor, David P. Allison. 
260 # # |a Amsterdam ;  |a New York :  |b Elsevier,  |c 2001. 
300 # # |a xii, 254 p. :  |b il. ;  |c 26 cm. 
504 # # |a Incluye referencias bibliográficas. 
111 2 # |a International Conference on Scanning Probe Microscopy, Sensors and Nanostructures  |n (2nd :  |d 2000 :  |c Heidelberg, Germany) 
700 1 # |a Allison, David P. 
246 1 4 |a Scanning probe microscopy, sensors & nanostructures 
246 3 0 |a Scanning probe microscopy, sensors and nanostructures 
246 3 0 |a Proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures 
650 # 0 |a Scanning probe microscopy  |v Congresses. 
650 # 0 |a Detectors  |v Congresses. 
650 # 0 |a Nanostructures  |v Congresses. 
049 # # |a AR5A 
490 1 # |a Ultramicroscopy ;  |v v. 86, nos. 1/2 
040 # # |a SOE  |c SOE  |d OCLCQ  |b spa  |d arbccab 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008137_nuevo-0  |o ULTRAMICROSCOPY 2001  |p 008137_nuevo-0  |t 1  |y BK