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010206s2001####ne#a#####b####100#0#eng#d |
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20060721115740.0 |
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|a SPM 2000 :
|b proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /
|c guest editor, David P. Allison.
|
260 |
# |
# |
|a Amsterdam ;
|a New York :
|b Elsevier,
|c 2001.
|
300 |
# |
# |
|a xii, 254 p. :
|b il. ;
|c 26 cm.
|
504 |
# |
# |
|a Incluye referencias bibliográficas.
|
111 |
2 |
# |
|a International Conference on Scanning Probe Microscopy, Sensors and Nanostructures
|n (2nd :
|d 2000 :
|c Heidelberg, Germany)
|
700 |
1 |
# |
|a Allison, David P.
|
246 |
1 |
4 |
|a Scanning probe microscopy, sensors & nanostructures
|
246 |
3 |
0 |
|a Scanning probe microscopy, sensors and nanostructures
|
246 |
3 |
0 |
|a Proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures
|
650 |
# |
0 |
|a Scanning probe microscopy
|v Congresses.
|
650 |
# |
0 |
|a Detectors
|v Congresses.
|
650 |
# |
0 |
|a Nanostructures
|v Congresses.
|
049 |
# |
# |
|a AR5A
|
490 |
1 |
# |
|a Ultramicroscopy ;
|v v. 86, nos. 1/2
|
040 |
# |
# |
|a SOE
|c SOE
|d OCLCQ
|b spa
|d arbccab
|
942 |
# |
# |
|c BK
|
952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 008137_nuevo-0
|o ULTRAMICROSCOPY 2001
|p 008137_nuevo-0
|t 1
|y BK
|