SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /

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Detalles Bibliográficos
Autor principal: International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : 2000 : Heidelberg, Germany)
Autor Corporativo: International Conference on Scanning Probe Microscopy, Sensors and Nanostructures
Otros Autores: Allison, David P.
Formato: Sin ejemplares
Lenguaje:Inglés
Publicado: Amsterdam ; New York : Elsevier, 2001.
Colección:Ultramicroscopy ; v. 86, nos. 1/2
Materias:
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