SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /

SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /

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Detalles Bibliográficos
Autor principal:	International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : 2000 : Heidelberg, Germany)
Autor Corporativo:	International Conference on Scanning Probe Microscopy, Sensors and Nanostructures
Otros Autores:	Allison, David P.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam ; New York : Elsevier, 2001.
Colección:	Ultramicroscopy ; v. 86, nos. 1/2
Materias:	Scanning probe microscopy > Congresses. Detectors > Congresses. Nanostructures > Congresses.

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