Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /
Guardado en:
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| Formato: | Sin ejemplares |
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| Publicado: |
Amsterdam, Netherlands :
North-Holland,
1990.
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| Colección: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms,
v. B49, nos. 1-4 (Apr. 1990) |
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| Notas: | Cover title: Proceedings of the 5th International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989. Incluye índice. |
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| Descripción Física: | xvii, 589 p. : il. ; 27 cm. |
| Bibliografía: | Incluye referencias bibliográficas. |
| ISSN: | 0168-583X ; |
