Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /

Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /

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Detalles Bibliográficos
Autor principal:	International Conference on Particle Induced X-Ray Emission and its Analytical Applications (5th : 1989 : Amsterdam, Netherlands)
Autor Corporativo:	International Conference on Particle Induced X-Ray Emission and its Analytical Applications
Otros Autores:	Vis, Ronald D.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam, Netherlands : North-Holland, 1990.
Colección:	Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, v. B49, nos. 1-4 (Apr. 1990)
Materias:	X-ray spectroscopy > Congresses.

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