Particle induced x-ray emission and its analytical applications : proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /

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Detalles Bibliográficos
Autor principal: International Conference on Particle Induced X-Ray Emission and its Analytical Applications (5th : 1989 : Amsterdam, Netherlands)
Autor Corporativo: International Conference on Particle Induced X-Ray Emission and its Analytical Applications
Otros Autores: Vis, Ronald D.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam, Netherlands : North-Holland, 1990.
Colección:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, v. B49, nos. 1-4 (Apr. 1990)
Materias:
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245 1 0 |a Particle induced x-ray emission and its analytical applications :  |b proceedings of the Fifth International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989 /  |c editor, Ronald D. Vis. 
260 # # |a Amsterdam, Netherlands :  |b North-Holland,  |c 1990. 
300 # # |a xvii, 589 p. :  |b il. ;  |c 27 cm. 
490 1 # |a Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms,  |x 0168-583X ;  |v v. B49, nos. 1-4 (Apr. 1990) 
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700 1 # |a Vis, Ronald D. 
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650 # 0 |a X-ray spectroscopy  |v Congresses. 
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504 # # |a Incluye referencias bibliográficas. 
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500 # # |a Cover title: Proceedings of the 5th International Conference on PIXE and its Analytical Applications, Amsterdam, The Netherlands, August 21-25, 1989. 
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